| Literature DB >> 26666697 |
Jiang Wu1, Andrew Ramsay2, Ana Sanchez3, Yunyan Zhang1, Dongyoung Kim1, Frederic Brossard2, Xian Hu4, Mourad Benamara4, Morgan E Ware4, Yuriy I Mazur4, Gregory J Salamo4, Martin Aagesen5, Zhiming Wang6, Huiyun Liu1.
Abstract
The III-V nanowire quantum dots (NWQDs) monolithically grown on silicon substrates, combining the advantages of both one- and zero-dimensional materials, represent one of the most promising technologies for integrating advanced III-V photonic technologies on a silicon microelectronics platform. However, there are great challenges in the fabrication of high-quality III-V NWQDs by a bottom-up approach, that is, growth by the vapor-liquid-solid method, because of the potential contamination caused by external metal catalysts and the various types of interfacial defects introduced by self-catalyzed growth. Here, we report the defect-free self-catalyzed III-V NWQDs, GaAs quantum dots in GaAsP nanowires, on a silicon substrate with pure zinc blende structure for the first time. Well-resolved excitonic emission is observed with a narrow line width. These results pave the way toward on-chip III-V quantum information and photonic devices on silicon platform.Entities:
Keywords: Nanowires; molecular beam epitaxy; quantum dots; self-catalyzed; vapor−liquid−solid
Year: 2015 PMID: 26666697 DOI: 10.1021/acs.nanolett.5b04142
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189