| Literature DB >> 26644360 |
Runyu Liu1, Xiang Zhao1, Christopher Roberts2, Lan Yu1, Parsian K Mohseni3, Xiuling Li1, Viktor Podolskiy2, Daniel Wasserman1.
Abstract
Metallic films with subwavelength apertures, integrated into a semiconductor by metal-assisted chemical etch (MacEtch), demonstrate enhanced transmission when compared to bare semiconductor surfaces. The resulting "buried" metallic structures are characterized spectroscopically and modeled using rigorous coupled wave analysis. These composite materials offer potential integration with optoelectronic devices, for simultaneous near-uniform electrical contact and strong optical coupling to free space.Entities:
Keywords: antireflection coatings; optical transmission; plasmonics; semiconductors, metallic films
Year: 2015 PMID： 26644360 DOI： 10.1002/adma.201505111
Source DB: PubMed Journal: Adv Mater ISSN： 0935-9648 Impact factor: 30.849