| Literature DB >> 26542747 |
Takafumi Uemura1,2, Cedric Rolin3, Tung-Huei Ke3, Pavlo Fesenko3, Jan Genoe3, Paul Heremans3, Jun Takeya1,2.
Abstract
Transistor parameter extraction by the conventional transconductance method can lead to a mobility overestimate. Organic transistors undergoing major contact resistance experience a significant drop in mobility upon mild annealing. Before annealing, strong field-dependent contact resistance yields nonlinear transfer curves with locally high transconductances, resulting in a mobility overestimate. After annealing, a contact resistance below 200 Ω cm is achieved, which is stable over a wide V(G) range.Keywords: carrier mobility; contact resistance; field-effect mobility; organic transistors
Year: 2015 PMID: 26542747 DOI: 10.1002/adma.201503133
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849