| Literature DB >> 26510769 |
Rui Li1,2, Hongfei Ye1, Weisheng Zhang1, Guojun Ma1, Yewang Su3,4.
Abstract
Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson's ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers.Entities:
Year: 2015 PMID: 26510769 PMCID: PMC4625185 DOI: 10.1038/srep15828
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Theoretical model of a rectangular AFM cantilever under a point load.
Figure 2(a) vs. for different , and (b) vs. for different of an end-tip-loaded rectangular cantilever.
Normalized load-point deflections of a rectangular cantilever with the point load P applied at the end tip (a/2,0).
| FEM | Present | Beam theory | Error of beam theory | ||
|---|---|---|---|---|---|
| 1/5 | 0 | 500.1 | 500.1 | 500 | |
| 0.25 | 493.3 | 493.3 | 500 | 1.4% | |
| 0.4 | 482.8 | 482.8 | 500 | 3.6% | |
| 2/9 | 0 | 364.6 | 364.6 | 364.5 | |
| 0.25 | 359.2 | 359.2 | 364.5 | 1.5% | |
| 0.4 | 350.8 | 350.8 | 364.5 | 3.9% | |
| 1/4 | 0 | 256.1 | 256.1 | 256 | |
| 0.25 | 251.9 | 251.9 | 256 | 1.6% | |
| 0.4 | 245.4 | 245.4 | 256 | 4.3% | |
| 2/7 | 0 | 171.6 | 171.6 | 171.5 | |
| 0.25 | 168.5 | 168.5 | 171.5 | 1.8% | |
| 0.4 | 163.6 | 163.6 | 171.5 | 4.8% | |
| 1/3 | 0 | 108.1 | 108.1 | 108 | |
| 0.25 | 105.9 | 105.9 | 108 | 2.0% | |
| 0.4 | 102.5 | 102.5 | 108 | 5.4% | |
| 2/5 | 0 | 62.61 | 62.61 | 62.5 | |
| 0.25 | 61.19 | 61.19 | 62.5 | 2.1% | |
| 0.4 | 58.90 | 58.90 | 62.5 | 6.1% | |
| 1/2 | 0 | 32.11 | 32.11 | 32 | |
| 0.25 | 31.30 | 31.30 | 32 | 2.2% | |
| 0.4 | 29.95 | 29.95 | 32 | 6.8% | |
| 2/3 | 0 | 13.61 | 13.61 | 13.5 | |
| 0.25 | 13.24 | 13.24 | 13.5 | 2.0% | |
| 0.4 | 12.59 | 12.59 | 13.5 | 7.2% | |
| 1 | 0 | 4.103 | 4.103 | 4 | |
| 0.25 | 4.007 | 4.007 | 4 | ||
| 0.4 | 3.789 | 3.789 | 4 | 5.6% | |
| 2 | 0 | 0.5847 | 0.5847 | 0.5 | |
| 0.25 | 0.5838 | 0.5838 | 0.5 | ||
| 0.4 | 0.5567 | 0.5567 | 0.5 | ||
*The beam theory-based normalized deflection25 .
Figure 3(a) Relative error of beam theory vs. for different , and (b) the error vs. for different of an end-tip-loaded rectangular cantilever.
Figure 4Comparison of plate and beam theories via three-dimensional plot of normalized deflection for an end-tip-loaded rectangular micro cantilever with v = 0.25 and a/b = 2. (a) Current analytic results from plate theory. (b) Results from beam theory.
Figure 5Schematic diagram for comparison of the spring constant between the plate theory and beam theory for a cantilever with v = 0.
(a) The plate model under a point load P. (b) The plate model under a uniformly distributed line load with the intensity of . (c) The constrained plate model under the same load as in (b). (d) The beam model under the same point load P as in (a).
Normalized spring constants of several end-tip-loaded rectangular cantilevers fabricated from Perspex.
| No. | Cantilever size | ||
|---|---|---|---|
| Ref. 21 | Present | ||
| 1 | b = 20 cm, t = 3 mm, a = 9.31 cm | 0.12 | 0.1221 |
| 2 | b = 20 cm, t = 3 mm, a = 6.53 cm | 0.085 | 0.08489 |
| 3 | b = 20 cm, t = 3 mm, a = 3.29 cm | 0.042 | 0.04206 |
Spring constants of several commercial rectangular cantilevers at end tips.
| No. | Cantilever type | |||
|---|---|---|---|---|
| Present | Ref. 26 | Error of Ref. 26 | ||
| 1 | Nanosensors PPP-NCCR-50 silicon tapping mode | |||
| 27.65 | 26.8 | |||
| 2 | Olympus OMCL-RC800PSA-1 Si3N4 contact mode | |||
| 0.9207 | 0.87 | −5.5% | ||
| 0.1122 | 0.11 | −2.0% | ||
| 3 | Nanosensors silicon extra tall tips | |||
| SD-PXL-FM | 7.388 | 7 | −5.3% | |
| SD-PXL-CON | 0.2332 | 0.22 | −5.7% | |