Literature DB >> 26456484

Graphene-Modified Interface Controls Transition from VCM to ECM Switching Modes in Ta/TaOx Based Memristive Devices.

Michael Lübben1, Panagiotis Karakolis2, Vassilios Ioannou-Sougleridis2, Pascal Normand2, Panagiotis Dimitrakis2, Ilia Valov1.   

Abstract

By modification of the electrode-solid-electrolyte interface with graphene, transit from valence change memories (VCM) to electrochemical metallization memories (ECM) in the cell Ta(C)/Ta2 O5 /Pt is demonstrated, thus, bridging both mechanisms. The ECM operation is discussed in the light of Ta-cation mobility in TaOx . The crucial role of electrochemical processes and moisture in the resistive switching process is also highlighted.
© 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Entities:  

Keywords:  electrochemical metallization memories; graphene; interfaces; redox-based resistive switching memories (ReRAM); valence change memories

Year:  2015        PMID: 26456484     DOI: 10.1002/adma.201502574

Source DB:  PubMed          Journal:  Adv Mater        ISSN: 0935-9648            Impact factor:   30.849


  13 in total

1.  Compliance-Free, Digital SET and Analog RESET Synaptic Characteristics of Sub-Tantalum Oxide Based Neuromorphic Device.

Authors:  Yawar Abbas; Yu-Rim Jeon; Andrey Sergeevich Sokolov; Sohyeon Kim; Boncheol Ku; Changhwan Choi
Journal:  Sci Rep       Date:  2018-01-19       Impact factor: 4.379

2.  Probing nanoscale oxygen ion motion in memristive systems.

Authors:  Yuchao Yang; Xiaoxian Zhang; Liang Qin; Qibin Zeng; Xiaohui Qiu; Ru Huang
Journal:  Nat Commun       Date:  2017-05-04       Impact factor: 14.919

3.  The Resistive Switching Characteristics in ZrO₂ and Its Filamentary Conduction Behavior.

Authors:  Chun-Hung Lai; Hung-Wei Chen; Chih-Yi Liu
Journal:  Materials (Basel)       Date:  2016-07-08       Impact factor: 3.623

4.  Electrochemical Oxidation Induced Multi-Level Memory in Carbon-Based Resistive Switching Devices.

Authors:  Paola Russo; Ming Xiao; Norman Y Zhou
Journal:  Sci Rep       Date:  2019-02-07       Impact factor: 4.379

5.  Light Driven Active Transition of Switching Modes in Homogeneous Oxides/Graphene Heterostructure.

Authors:  Xiaoli Chen; Kelin Zeng; Xin Zhu; Guanglong Ding; Ting Zou; Chen Zhang; Kui Zhou; Ye Zhou; Su-Ting Han
Journal:  Adv Sci (Weinh)       Date:  2019-04-12       Impact factor: 16.806

6.  Impact of Line Edge Roughness on ReRAM Uniformity and Scaling.

Authors:  Vassilios Constantoudis; George Papavieros; Panagiotis Karakolis; Ali Khiat; Themistoklis Prodromakis; Panagiotis Dimitrakis
Journal:  Materials (Basel)       Date:  2019-11-30       Impact factor: 3.623

7.  Integration scheme of nanoscale resistive switching memory using bottom-up processes at room temperature for high-density memory applications.

Authors:  Un-Bin Han; Jang-Sik Lee
Journal:  Sci Rep       Date:  2016-07-01       Impact factor: 4.379

8.  Demonstration of Synaptic Behaviors and Resistive Switching Characterizations by Proton Exchange Reactions in Silicon Oxide.

Authors:  Yao-Feng Chang; Burt Fowler; Ying-Chen Chen; Fei Zhou; Chih-Hung Pan; Ting-Chang Chang; Jack C Lee
Journal:  Sci Rep       Date:  2016-02-16       Impact factor: 4.379

9.  Modulating memristive performance of hexagonal WO3 nanowire by water-oxidized hydrogen ion implantation.

Authors:  Yong Zhou; Yuehua Peng; Yanling Yin; Fang Zhou; Chang Liu; Jing Ling; Le Lei; Weichang Zhou; Dongsheng Tang
Journal:  Sci Rep       Date:  2016-09-07       Impact factor: 4.379

10.  Water-Mediated Ionic Migration in Memristive Nanowires with a Tunable Resistive Switching Mechanism.

Authors:  Gianluca Milano; Federico Raffone; Michael Luebben; Luca Boarino; Giancarlo Cicero; Ilia Valov; Carlo Ricciardi
Journal:  ACS Appl Mater Interfaces       Date:  2020-10-14       Impact factor: 9.229

View more

北京卡尤迪生物科技股份有限公司 © 2022-2023.