Literature DB >> 26429250

Technical Note: Influence of Compton currents on profile measurements in small-volume ion chambers.

Sean Tanny1, Shannon Holmes2, Nicholas Sperling1, E Ishmael Parsai1.   

Abstract

PURPOSE: This work is to evaluate the effects of Compton current generation in three small-volume ionization chambers on measured beam characteristics for electron fields.
METHODS: Beam scans were performed using Exradin A16, A26, and PTW 31014 microchambers. Scans with varying chamber components shielded were performed. Static point measurements, output factors, and cable only irradiations were performed to determine the contribution of Compton currents to various components of the chamber. Monte Carlo simulations were performed to evaluate why one microchamber showed a significant reduction in Compton current generation.
RESULTS: Beam profiles demonstrated significant distortion for two of the three chambers when scanned parallel to the chamber axis, produced by electron deposition within the wire. Measurements of ionization produced within the cable identified Compton current generation as the cause of these distortions. The size of the central collecting wire was found to have the greatest influence on the magnitude of Compton current generation.
CONCLUSIONS: Microchambers can demonstrate significant (>5%) deviations from properties as measured with larger volume chambers (0.125 cm(3) and above). These deviations can be substantially reduced by averaging measurements conducted at opposite polarities.

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Year:  2015        PMID: 26429250     DOI: 10.1118/1.4929555

Source DB:  PubMed          Journal:  Med Phys        ISSN: 0094-2405            Impact factor:   4.071


  1 in total

1.  Electrometer offset current due to scattered radiation.

Authors:  Sonja Wegener; Otto A Sauer
Journal:  J Appl Clin Med Phys       Date:  2018-10-09       Impact factor: 2.102

  1 in total

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