Wen Yang1, Michael Fronk2, Yang Geng1, Lin Chen3, Qing-Qing Sun4, Ovidiu D Gordan2, Peng Zhou1, Dietrich R T Zahn2, David Wei Zhang1. 1. Institute of Advanced Nanodevices, School of Microelectronics, Fudan University, No. 220 Handan Road, Shanghai, 200433, China. 2. Semiconductor Physics, Technische Universität Chemnitz, Reichenhainer Straße 70, Chemnitz, D-09107, Germany. 3. Institute of Advanced Nanodevices, School of Microelectronics, Fudan University, No. 220 Handan Road, Shanghai, 200433, China. linchen@fudan.edu.cn. 4. Institute of Advanced Nanodevices, School of Microelectronics, Fudan University, No. 220 Handan Road, Shanghai, 200433, China. qqsun@fudan.edu.cn.
The authors of Nanoscale Research Letters 2015, 10:32 (DOI 10.1186/s11671-014-0724-z) [1] omitted to acknowledge that all ellipsometric data discussed in the article, including those displayed in Figure 1, were recorded in the laboratory of the Semiconductor Physics Group, Institut für Experimentelle Physik, Universitāt Leipzig, with the active involvement and under the guidance of Tammo Böntgen, Rüdiger Schmidt-Grund, and Marius Grundmann.
Authors: Wen Yang; Michael Fronk; Yang Geng; Lin Chen; Qing-Qing Sun; Ovidiu D Gordan; Peng Zhou; Dietrich Rt Zahn; David Wei Zhang Journal: Nanoscale Res Lett Date: 2015-02-05 Impact factor: 4.703