| Literature DB >> 26419707 |
Yuhang Zhang1, Yan Li1, Yanmei Ma1, Yuwei Li1, Guanghui Li1, Xuecheng Shao1, Hui Wang1, Tian Cui1, Xin Wang1, Pinwen Zhu1.
Abstract
Recently, Ag2Te was experimentally confirmed to be a 3D topological insulator (TI) at ambient pressure. However, the high-pressure behaviors and properties of Ag2Te were rarely reported. Here, a pressure-induced electronic topological transition (ETT) is firstly found in Ag2Te at 1.8 GPa. Before ETT, the positive pressure coefficient of bulk band-gap, which is firstly found in TIs family, is found by both first-principle calculations and in situ high-pressure resistivity measurements. The electrical resistivity obtained at room temperature shows a maximum at 1.8 GPa, which is nearly 3.3 times to that at ambient pressure. This result indicates that the best bulk insulating character and topological nature in Ag2Te can be obtained at this pressure. Furthermore, the high-pressure structural behavior of Ag2Te has been investigated by in situ high-pressure synchrotron powder X-ray diffraction technique up to 33.0 GPa. The accurate pressure-induced phase transition sequence is firstly determined as P21/c → Cmca → Pnma. It is worth noting that the reported isostructural P21/c phase is not existed, and the reported structure of Cmca phase is corrected by CALYPSO methodology. The second high-pressure structure, a long puzzle to previous reports, is determined as Pnma phase. A pressure-induced metallization in Ag2Te is confirmed by the results of temperature-dependent resistivity measurements.Entities:
Year: 2015 PMID: 26419707 PMCID: PMC4588579 DOI: 10.1038/srep14681
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Angle dispersive X-ray powder diffraction patterns of Ag2Te under high pressure at room temperature.
Arrow and asterisk represent new diffraction peaks.
Rietveld refinement results for 2.2 GPa.
| Pressure (GPa) | 2.2 | |
|---|---|---|
| Space group | ||
| 8.0113(1) | 6.076(1) | |
| 4.4091(4) | 6.3800(1) | |
| 8.8827(1) | 13.4400(3) | |
| 123.1346(7) | — | |
| −0.0115(2) | 0.7500 | |
| 0.1737(1) | −0.0696(8) | |
| 0.3701(1) | 0.2500 | |
| 0.3095(8) | 1.0000 | |
| 0.8200(1) | 0.2421(1) | |
| 0.9889(9) | −0.1231(3) | |
| 0.2758(8) | 1.0000 | |
| 0.1815(1) | 0.2551(1) | |
| 0.2563(9) | −0.8854(2) | |
Rietveld refinement results for 25.5 GPa.
| Pressure (GPa) | 25.5 | |
|---|---|---|
| Space group | ||
| 5.6399(9) | 12.6999(9) | |
| 6.0000(0) | 4.1479(9) | |
| 12.5799(9) | 4.0000(0) | |
| 0.7500 | 0.2413(5) | |
| 0.056(4) | 0.2500 | |
| −0.2500 | 0.4484(8) | |
| 1.0000 | 0.4115(3) | |
| 0.247(2) | 0.7500 | |
| −0.0943(1) | 0.4534(1) | |
| 1.0000 | 0.6006(2) | |
| 0.250(2) | 0.7500 | |
| −0.9032(1) | 0.0827(1) | |
Figure 2(a) Lattice parameters and (b) lattice constant ratios as a function of pressure for the P21/c phase. The solid lines are guide for the eyes. Errors given by the GSAS EXPGUI package are smaller than the marker sizes.
Figure 3Resistivity as a function of pressure for Ag2Te at room temperature.
Figure 4Calculated band structures of Ag2Te at (a) ambient pressure, (b) 1.0 GPa, and (c) 2.0 GPa, respectively. Total DOS and PDOS results of Ag2Te at (d) ambient pressure, (e) 1.0 GPa, and (f) 2.0 GPa, respectively.
Figure 5(a) Temperature dependence of resistivity for Ag2Te. The inset shows resistivity vs temperature at 1.6, 1.8, and 4.1 GPa, respectively. (b) Pressure dependence of the carrier activation energy for Ag2Te.