| Literature DB >> 26414685 |
Yen-Fu Lin1, Yong Xu2, Che-Yi Lin1, Yuen-Wuu Suen1, Mahito Yamamoto3, Shu Nakaharai3, Keiji Ueno4, Kazuhito Tsukagoshi3.
Abstract
Low-frequency current fluctuations are monitored and the mechanism of electric noise investigated in layered 2H-type α-molybdenum ditelluride transistors. The charge transport mechanism of electric noise in atomically thin transition-metal dichalcogenides is studied under different environments; the development of a new sensing functionality may be stimulated.Entities:
Keywords: MoTe2; low-frequency noise; nanoscale electronics; random telegraph signals; transition metal dichalcogenides
Year: 2015 PMID: 26414685 DOI: 10.1002/adma.201502677
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849