| Literature DB >> 26413051 |
Jorge Enrique Madrigal-Arias1, Rosalba Argumedo-Delira2, Alejandro Alarcón3, Ma Remedios Mendoza-López2, Oscar García-Barradas2, Jesús Samuel Cruz-Sánchez2, Ronald Ferrera-Cerrato3, Maribel Jiménez-Fernández4.
Abstract
In an effort to develop alternate techniques to recover metals from waste electrical and electronic equipment (WEEE), this research evaluated the bioleaching efficiency of gold (Au), copper (Cu) and nickel (Ni) by two strains of Aspergillus niger in the presence of gold-plated finger integrated circuits found in computer motherboards (GFICMs) and cellular phone printed circuit boards (PCBs). These three metals were analyzed for their commercial value and their diverse applications in the industry. Au-bioleaching ranged from 42 to 1% for Aspergillus niger strain MXPE6; with the combination of Aspergillus niger MXPE6 + Aspergillus niger MX7, the Au-bioleaching was 87 and 28% for PCBs and GFICMs, respectively. In contrast, the bioleaching of Cu by Aspergillus niger MXPE6 was 24 and 5%; using the combination of both strains, the values were 0.2 and 29% for PCBs and GFICMs, respectively. Fungal Ni-leaching was only found for PCBs, but with no significant differences among treatments. Improvement of the metal recovery efficiency by means of fungal metabolism is also discussed.Entities:
Keywords: Aspergillus; PCBs; WEEE; bioleaching; gold
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Substances:
Year: 2015 PMID: 26413051 PMCID: PMC4568885 DOI: 10.1590/S1517-838246320140256
Source DB: PubMed Journal: Braz J Microbiol ISSN: 1517-8382 Impact factor: 2.476
Figure 1Growth response of two A. niger strains exposed to four doses of AuCl3 (mg L−1) for 11 days. a) A. niger MXPE6 and b) A. nigerMX7
Figure 2Growth response of four Aspergillus strains exposed to four doses of AuCl3 (mg L−1) for 11 days. a–b) Fungal growth of A. niger MXPE6 and A. niger MX7; c–d) fungal growth of Aspergillus sp. MXPE8 and Aspergillus sp. MX9
Content of gold (Au), copper (Cu) and nickel (Ni) from samples of printed circuit boards of celullar phones (PCBs) and the gold-plated finger integrated circuits found in computer motherboards (GFICMs)
| Metal type | Metal content (% w/w) | |
|---|---|---|
|
| ||
| PCBs | GFMBCs | |
| Au | 0.0038 ± 0.0002 | 0.0607 ± 0.0001 |
| Cu | 21.4 ± 0.04 | 48.3 ± 0.05 |
| Ni | 0.51 ± 0.003 | 0.51 ± 0.001 |
Means ± Standard error.
Figure 3Gold and copper leaching from electronic waste by an Aspergillus consortium (A. nigerMXPE6 + A. niger MX7) and A. nigerMXPE6 after 14 days at 28 °C. a) Au-bioleaching from printed circuit boards of cellular phones (PCBs), b) Au-bioleaching at gold-plated finger integrated circuits found in computer motherboards (GFICMs), c) Cu-bioleaching from printed circuit boards of cellular phones, and d) Au-bioleaching at gold-plated finger integrated circuits found in computer motherboards. n = 3, Means ± standard
Figure 4Dry biomass of the Aspergillus consortium (A. niger MXPE6 + A. niger MX7) and A. niger MXPE6 exposed to printed circuit boards of cellular phones (PCBs) and gold-plated finger integrated circuits found in computer motherboards (GFICMs) after 14 days at 28 °C (n = 3, Means ± standard error)
Figure 5Variations of pH induced by the Aspergillusconsortium (A. niger MXPE6 + A. nigerMX7) and A. niger MXPE6 exposed to printed circuit boards of cellular phones (PCBs) and gold-plated finger integrated circuits found in computer motherboards (GFICMs) after 14 days at 28 °C (n = 3, Means ± standard error)