Literature DB >> 26373378

A Compact "Water Window" Microscope with 60 nm Spatial Resolution for Applications in Biology and Nanotechnology.

Przemyslaw Wachulak1, Alfio Torrisi1, Muhammad F Nawaz2, Andrzej Bartnik1, Daniel Adjei1, Šárka Vondrová3, Jana Turňová3, Alexandr Jančarek2, Jiří Limpouch2, Miroslava Vrbová3, Henryk Fiedorowicz1.   

Abstract

Short illumination wavelength allows an extension of the diffraction limit toward nanometer scale; thus, improving spatial resolution in optical systems. Soft X-ray (SXR) radiation, from "water window" spectral range, λ=2.3-4.4 nm wavelength, which is particularly suitable for biological imaging due to natural optical contrast provides better spatial resolution than one obtained with visible light microscopes. The high contrast in the "water window" is obtained because of selective radiation absorption by carbon and water, which are constituents of the biological samples. The development of SXR microscopes permits the visualization of features on the nanometer scale, but often with a tradeoff, which can be seen between the exposure time and the size and complexity of the microscopes. Thus, herein, we present a desk-top system, which overcomes the already mentioned limitations and is capable of resolving 60 nm features with very short exposure time. Even though the system is in its initial stage of development, we present different applications of the system for biology and nanotechnology. Construction of the microscope with recently acquired images of various samples will be presented and discussed. Such a high resolution imaging system represents an interesting solution for biomedical, material science, and nanotechnology applications.

Entities:  

Keywords:  Fresnel zone plates; SXR microscopy; Soft X-rays (SXR); gas puff target source; “water window”

Mesh:

Substances:

Year:  2015        PMID: 26373378     DOI: 10.1017/S1431927615014750

Source DB:  PubMed          Journal:  Microsc Microanal        ISSN: 1431-9276            Impact factor:   4.127


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Journal:  J Vis Exp       Date:  2017-04-03       Impact factor: 1.355

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  3 in total

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