| Literature DB >> 26367351 |
Sardar B Alam1, Federico Panciera2,3, Ole Hansen1,4, Kristian Mølhave1, Frances M Ross3.
Abstract
The formation of self-assembled contacts between vapor-liquid-solid grown silicon nanowires and flat silicon surfaces was imaged in situ using electron microscopy. By measuring the structural evolution of the contact formation process, we demonstrate how different contact geometries are created by adjusting the balance between silicon deposition and Au migration. We show that electromigration provides an efficient way of controlling the contact. The results point to novel device geometries achieved by direct nanowire growth on devices.Entities:
Keywords: CVD; Nanowire integration; Si nanowire growth; TEM; cantilever; in situ manipulation
Year: 2015 PMID: 26367351 DOI: 10.1021/acs.nanolett.5b02178
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189