| Literature DB >> 26330058 |
Tara D Edwards1, Yuguang Yang1, W Neil Everett2, Michael A Bevan1.
Abstract
The ability to create multi-scale, periodic colloidal assemblies with unique properties is important to emerging applications. Dynamically manipulating colloidal structures via tunable kT-scale attraction can provide the opportunity to create particle-based nano- and microstructured materials that are reconfigurable. Here, we report a novel tactic to obtain reconfigurable, multi-scale, periodic colloidal assemblies by combining thermoresponsive depletant particles and patterned topographical features that, together, reversibly mediate local kT-scale depletion interactions. This method is demonstrated in optical microscopy experiments to produce colloidal microstructures that reconfigure between well-defined ordered structures and disordered fluid states as a function of temperature and pattern feature depth. These results are well described by Monte Carlo simulations using theoretical depletion potentials that include patterned excluded volume. Ultimately, the approach reported here can be extended to control the size, shape, orientation, and microstructure of colloidal assemblies on multiple lengths scales and on arbitrary pre-defined pattern templates.Entities:
Year: 2015 PMID: 26330058 PMCID: PMC4557032 DOI: 10.1038/srep13612
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Reversible multi-scale assembly of charged ~2 μm diameter SiO2 colloids above topographical surface patterns resulting from thermoresponsive hydrogel nanoparticle-mediated depletion interactions.
(a) Schematic of charged SiO2 colloids (gray circles) experiencing depletion attraction with each other and a topographical feature due to the exclusion of the smaller spherical depletants (cyan circles). When the surface-to-surface separation between particles or particles and the underlying feature is less than the depletant diameter, 2L, (light red areas) the depletants are excluded from the overlapping regions (darker red areas). Inset is a top-down view of SiO2 colloids experiencing depletion interactions with a circular patterned feature. (b) Microscopy image of etched circles arranged on a hexagonal lattice. Inset is an SEM image of a cross-section showing the resulting sidewall geometry with an overlaid representation of a silica colloid. (c) Hydrodynamic diameter of PNIPAM depletant nanoparticles in 1 mM NaCl as a function of temperature. (d–f) Experimental images extracted from video microscopy measurements of equilibrated multi-scale self-assembled SiO2 particles at 25 °C (PNIPAM 2L ≅ 113 nm) localized to the edges of ~285 nm deep (d) 20 μm × 20 μm squares, (e) 20 μm circles on a hexagonal lattice, and (f) 20 μm wide channels.
Figure 2Structural, spatial, and statistical information obtained from video microscopy of equilibrated colloidal assembly as a function of topographical surface pattern depth.
Results shown for patterned 12 μm circles arranged on a square lattice with (a) H = 285 nm, (b) H = 90 nm, (c) H = 35 nm deep at ~25 °C in the presence of ~113 nm diameter PNIPAM hydrogel nanoparticles. (left-to-right) Experimental images extracted from video microscopy, dynamic traces of 2D particle trajectories over patterns from the first 1,000 experimental frames (~36 s), contour plots of 2D density profiles with experimental particle center coordinates averaged over all features, and 1D radial density profiles from experiments (red) and MC simulations (black) (except for H = 35 nm experiment where pattern edges could not be resolved).
Parameters for experimental analysis and MC simulations in Figs 2, 3, 4 at each etched circular pattern well depth, H, and each temperature, T (i.e., depletant diameter, 2L).
| 1100 | |
| 1.92 | |
| 1.0 | |
| κ−1 | 9.5 |
| ψ | –50 |
| T | 25, 25, 25, 25, 35, 37 |
| 2L | 113, 113, 113, 113, 107, 53 |
| 2R | 17 |
| D | 21 |
| H | 35, 90, 285, 285, 285, 285 |
| N | 672, 332, 332, 332, 332, 324 |
| ϕA | 0.36, 0.18, 0.18, 0.18, 0.18, 0.18 |
| zm | 61, 61, 61, 61, 66, 100 |
| Π | 2.6, 2.6, 2.6, 2.6, 1.8, 0.54 |
| 7.46e−3, 2.10e−2, 2.03e−2, 2.26e−2, 1.17e−2, 6.67e−4 |
aparticle radius previously obtained from measured gravitational potential using Total Internal Reflection Microscopy12;
bSiO2 colloid density (for Stöber SiO2)55;
cwater density;
dDebye screening length calculated (Eq. (S3)) and from conductivity;
eparticle and wall electrostatic potential previously fit to potential energy profiles in previous work4856;
ftemperature from in situ thermocouple;
gdepletant particle diameter from dynamic light scattering (Fig. 1c);
hpatterned circle diameter and
icenter-to-center pattern spacing from scanning electron microscopy;
jpatterned well depth from ten averaged profilometry measurements;
knumber of particles from image analysis;
lcolloid area fraction from image analysis;
mmost probable height calculated using Eqs. (S6)-(S7);
nosmotic pressure calculated using Carnahan-Starling equation of state111245;
omaximum colloid density value from image analysis.
Figure 3Structural, spatial, and statistical information obtained from video microscopy of equilibrated colloidal assembly as a function of temperature (i.e., depletant size).
Results shown for patterned 12 μm diameter circles arranged on a square lattice with H = 285 nm deep in the presence of PNIPAM hydrogel nanoparticle depletants at (a) 25 °C (2L ≅ 113 nm), (b) 35 °C (2L ≅ 107 nm), and (c) 37 °C (2L ≅ 53 nm). (left-to-right) Experimental images extracted from video microscopy, dynamic traces of 2D particle trajectories over patterns from the first 1,000 experimental frames (~36 s), contour plots of 2D density profiles with experimental particle center coordinates averaged over all features, and 1D radial density profiles from experiments (red) and MC simulations (black).
Figure 4Density, free energy, and potential energy (with osmotic pressure/excluded volume contributions) for particles at pattern feature edge vs. depletant size and feature depth.
(a) Density at pattern edge, ρE, relative to density on pattern interior as reference state, ρR, vs. depletant size, 2L, for H = 285 nm and vs. pattern depth, H, for 2L = 113 nm. Ratio of densities plotted on the right-hand-side on an exponential scale to show Boltzmann relationship, ρE/ρR = exp[−(WE − WR)/kT], to the left-hand-side showing free energy difference between particles at the pattern edge, WE, compared to the pattern interior, WR (i.e., reference state). (b) Osmotic pressure, Π, and excluded volume, VX, vs. depletant size, 2L, and vs. depletion attraction minimum, UD,M, based on particle-wall depletion attraction, which is related by a factor to depletion attraction at the pattern edge (i.e., pattern edge VX can be considered as some combination of 2 walls) for different H and wall angles. Note that the scale for UD,M has a non-linear relationship to the 2L scale and is plotted as text to simply show values corresponding to UD,M.