Literature DB >> 26321859

Modeling Image Patches with a Generic Dictionary of Mini-Epitomes.

George Papandreou1, Liang-Chieh Chen2, Alan L Yuille3.   

Abstract

The goal of this paper is to question the necessity of features like SIFT in categorical visual recognition tasks. As an alternative, we develop a generative model for the raw intensity of image patches and show that it can support image classification performance on par with optimized SIFT-based techniques in a bag-of-visual-words setting. Key ingredient of the proposed model is a compact dictionary of mini-epitomes, learned in an unsupervised fashion on a large collection of images. The use of epitomes allows us to explicitly account for photometric and position variability in image appearance. We show that this flexibility considerably increases the capacity of the dictionary to accurately approximate the appearance of image patches and support recognition tasks. For image classification, we develop histogram-based image encoding methods tailored to the epitomic representation, as well as an "epitomic footprint" encoding which is easy to visualize and highlights the generative nature of our model. We discuss in detail computational aspects and develop efficient algorithms to make the model scalable to large tasks. The proposed techniques are evaluated with experiments on the challenging PASCAL VOC 2007 image classification benchmark.

Entities:  

Year:  2014        PMID: 26321859      PMCID: PMC4550088          DOI: 10.1109/CVPR.2014.264

Source DB:  PubMed          Journal:  Proc IEEE Comput Soc Conf Comput Vis Pattern Recognit        ISSN: 1063-6919


  3 in total

1.  Cluster-based probability model and its application to image and texture processing.

Authors:  K Popat; R W Picard
Journal:  IEEE Trans Image Process       Date:  1997       Impact factor: 10.856

2.  Emergence of simple-cell receptive field properties by learning a sparse code for natural images.

Authors:  B A Olshausen; D J Field
Journal:  Nature       Date:  1996-06-13       Impact factor: 49.962

3.  Efficient additive kernels via explicit feature maps.

Authors:  Andrea Vedaldi; Andrew Zisserman
Journal:  IEEE Trans Pattern Anal Mach Intell       Date:  2012-03       Impact factor: 6.226

  3 in total
  2 in total

1.  An Active Patch Model for Real World Texture and Appearance Classification.

Authors:  Junhua Mao; Jun Zhu; Alan L Yuille
Journal:  Comput Vis ECCV       Date:  2014-09-06

2.  The visual system's internal model of the world.

Authors:  Tai Sing Lee
Journal:  Proc IEEE Inst Electr Electron Eng       Date:  2015-07-06       Impact factor: 10.961

  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.