| Literature DB >> 26319279 |
Bob Taber1, Albert Zens2.
Abstract
We report in this paper an analysis of double-tuned (1)H/(2)H circuits that are capacitively or inductively matched to 50 Ω ports. In this analysis we use a novel new parameter called the circuit fill factor (CFF). It provides a means of characterizing the performance degradation associated with additional inductors in the circuit in addition to circuit losses. This parameter allows for quick and insightful analysis of multiple tuned circuits for efficiency. It is also shown that magnetically coupled double-tuned circuits are less prone to unwanted spurious resonances due to their general symmetry which eliminates multiple ground paths in the circuit.Entities:
Keywords: Double-tuned circuit; Magnetic coupling
Year: 2015 PMID: 26319279 DOI: 10.1016/j.jmr.2015.07.011
Source DB: PubMed Journal: J Magn Reson ISSN: 1090-7807 Impact factor: 2.229