| Literature DB >> 26305164 |
Xuexia He1, Fucai Liu1, Peng Hu1, Wei Fu1, Xingli Wang2, Qingsheng Zeng1, Wu Zhao1,3, Zheng Liu1.
Abstract
Recently, anisotropic 2D materials, such as black phosphorus and rhenium disulfides (ReS2 ), have attracted a lot attention because of their unique applications on electronics and optoelectronics. In this work, the direct growth of high-quality ReS2 atomic layers and nanoribbons has been demonstrated by using chemical vapor deposition (CVD) method. A possible growth mechanism is proposed according to the controlled experiments. The CVD ReS2-based filed-effect transistors (FETs) show n-type semiconducting behavior with a current on/off ratio of ≈10(6) and a charge carrier mobility of ≈9.3 cm(2) Vs(-1). These results suggested that the quality of CVD grown ReS2 is comparable to mechanically exfoliated ReS2, which is also further supported by atomic force microscopy imaging, high-resolution transmission electron microscopy imaging and thickness-dependent Raman spectra. The study here indicates that CVD grown ReS2 may pave the way for the large-scale fabrication of ReS2-based high-performance optoelectronic devices, such as anisotropic FETs and polarization detection.Entities:
Keywords: 2D materials; anisotropy; chemical vapor deposition; field effect transistors; rhenium disulphide
Year: 2015 PMID: 26305164 DOI: 10.1002/smll.201501488
Source DB: PubMed Journal: Small ISSN: 1613-6810 Impact factor: 13.281