| Literature DB >> 26300618 |
Angelika Basch1, Fiona Beck2, Thomas Söderström3, Sergey Varlamov3, Kylie R Catchpole4.
Abstract
A novel method, snow globe coating, is found to show significant enhancement of the short circuit current JSC (35%) when applied as a scattering back reflector for polycrystalline silicon thin-film solar cells. The coating is formed from high refractive index titania particles without containing binder and gives close to 100% reflectance for wavelengths above 400 nm. Snow globe coating is a physicochemical coating method executable in pH neutral media. The mild conditions of this process make this method applicable to many different types of solar cells.Entities:
Keywords: dielectric materials; light trapping; refractive index; semiconductors; thin films; zeta-potential
Year: 2012 PMID: 26300618 PMCID: PMC4538979 DOI: 10.1002/pip.2240
Source DB: PubMed Journal: Prog Photovolt ISSN: 1062-7995 Impact factor: 7.953
Figure 1Snow globe (SG) coating method: (a) dispersed titania particles form a binder free coating (SG coating) after settling by gravity. Scanning electron micrograph of titania particles, (b) scale bar is 10 µm; (c) scale bar is 200 nm.
Figure 2The pH as a function of the zeta-potential. The isoelectric point of titania is found at a pH of 5.3.
Figure 3External quantum efficiency (EQE) of a plain (solid line), two painted (dotted line) for paint 1 and (dashed line) for paint 2 and a TiO2 coated cell (full line). The coating was performed with particles (about 1 μm) using the SG coating method.
Enhancement of short circuit current J of titania coated solar cells
| Sample | Enhancement (%) | |
|---|---|---|
| Cell plain | 13.9 | – |
| Cell paint1 | 17.7 | 27 |
| Cell paint2 | 17.4 | 25 |
| Cell SG coated | 18.7 | 35 |
Figure 4Experimental reflection of SG coating (solid line), paint 1 (dotted line) and paint 2 (dotted line).
Figure 5Enhancement of the experimental EQE compared with the modelled data for (top) SG, (middle) paint 1 and (bottom) paint 2 coatings. Inset: modelled narrowed Lambertian, I Θ = cos[asin(nSi/neff ∗ sin Θ)], with n = 1.4.
Summary of enhancements for modelled and measured data for a 2-µm thick silicon film in the range 300–1200 nm
| Coating | Λabs, MODEL | Λabs, EXP | ||
|---|---|---|---|---|
| SG coating | 1.4 | 100 | 33 | 35 |
| Paint 1 | 1.4 | 90 | 29 | 27 |
| Paint 2 | 1.4 | 85 | 26 | 26 |
| Lambertian | nSi | 100 | 87 | – |