| Literature DB >> 26279586 |
Wanyeong Jung1, Seokhyeon Jeong1, Sechang Oh1, Dennis Sylvester1, David Blaauw1.
Abstract
Entities:
Year: 2015 PMID: 26279586 PMCID: PMC4535190 DOI: 10.1109/ISSCC.2015.7063137
Source DB: PubMed Journal: IEEE J Solid-State Circuits ISSN: 0018-9200 Impact factor: 5.013