| Literature DB >> 26278452 |
Olivier Sublemontier1, Christophe Nicolas2, Damien Aureau3, Minna Patanen2, Harold Kintz1, Xiaojing Liu2, Marc-André Gaveau1, Jean-Luc Le Garrec4, Emmanuel Robert2, Flory-Anne Barreda1,2, Arnaud Etcheberry3, Cécile Reynaud1, James B Mitchell4, Catalin Miron2.
Abstract
X-ray photoelectron spectroscopy (XPS) is a very efficient and still progressing surface analysis technique. However, when applied to nano-objects, this technique faces drawbacks due to interactions with the substrate and sample charging effects. We present a new experimental approach to XPS based on coupling soft X-ray synchrotron radiation with an in-vacuum beam of free nanoparticles, focused by an aerodynamic lens system. The structure of the Si/SiO2 interface was probed without any substrate interaction or charging effects for silicon nanocrystals previously oxidized in ambient air. Complete characterization of the surface was obtained. The Si 2p core level spectrum reveals a nonabrupt interface.Entities:
Keywords: Isolated Nanoparticles; Nanocharacterization; Si/SiO2 interface; Silicon Nanocrystals; Synchrotron Radiation; X-ray Photoelectron Spectroscopy
Year: 2014 PMID: 26278452 DOI: 10.1021/jz501532c
Source DB: PubMed Journal: J Phys Chem Lett ISSN: 1948-7185 Impact factor: 6.475