| Literature DB >> 26244850 |
Qiucheng Li1, Xiaolong Zou, Mengxi Liu1, Jingyu Sun1, Yabo Gao1, Yue Qi1, Xiebo Zhou1,2, Boris I Yakobson, Yanfeng Zhang1,2, Zhongfan Liu1.
Abstract
Grain boundaries (GBs) of hexagonal boron nitride (h-BN) grown on Cu(111) were investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The first experimental evidence of the GBs composed of square-octagon pairs (4|8 GBs) was given, together with those containing pentagon-heptagon pairs (5|7 GBs). Two types of GBs were found to exhibit significantly different electronic properties, where the band gap of the 5|7 GB was dramatically decreased as compared with that of the 4|8 GB, consistent with our obtained result from density functional theory (DFT) calculations. Moreover, the present work may provide a possibility of tuning the inert electronic property of h-BN via grain boundary engineering.Entities:
Keywords: Boron nitride; STM/STS; chemical vapor deposition; electronic properties; grain boundary
Year: 2015 PMID: 26244850 DOI: 10.1021/acs.nanolett.5b01852
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189