Literature DB >> 26206941

High-resolution imaging by scanning electron microscopy of semithin sections in correlation with light microscopy.

Daisuke Koga1, Satoshi Kusumi2, Ryusuke Shodo3, Yukari Dan4, Tatsuo Ushiki2.   

Abstract

In this study, we introduce scanning electron microscopy (SEM) of semithin resin sections. In this technique, semithin sections were adhered on glass slides, stained with both uranyl acetate and lead citrate, and observed with a backscattered electron detector at a low accelerating voltage. As the specimens are stained in the same manner as conventional transmission electron microscopy (TEM), the contrast of SEM images of semithin sections was similar to TEM images of ultrathin sections. Using this technique, wide areas of semithin sections were also observed by SEM, without the obstruction of grids, which was inevitable for traditional TEM. This study also applied semithin section SEM to correlative light and electron microscopy. Correlative immunofluorescence microscopy and immune-SEM were performed in semithin sections of LR white resin-embedded specimens using a FluoroNanogold-labeled secondary antibody. Because LR white resin is hydrophilic and electron stable, this resin is suitable for immunostaining and SEM observation. Using correlative microscopy, the precise localization of the primary antibody was demonstrated by fluorescence microscopy and SEM. This method has great potential for studies examining the precise localization of molecules, including Golgi- and ER-associated proteins, in correlation with LM and SEM.
© The Author 2015. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Entities:  

Keywords:  FluoroNanogold; backscattered electron; correlative light and electron microscopy; immune-SEM; scanning electron microscopy; semithin section

Mesh:

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Year:  2015        PMID: 26206941     DOI: 10.1093/jmicro/dfv042

Source DB:  PubMed          Journal:  Microscopy (Oxf)        ISSN: 2050-5698            Impact factor:   1.571


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