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Literature DB >> 26201889

Dislocation networks: Shedding coherent light on defects.

Felix Hofmann¹.

Abstract

Year: 2015 PMID： 26201889 DOI： 10.1038/nmat4334

Source DB: PubMed Journal: Nat Mater ISSN： 1476-1122 Impact factor: 43.841

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8 in total

1. Three-dimensional high-resolution quantitative microscopy of extended crystals.

Authors: P Godard; G Carbone; M Allain; F Mastropietro; G Chen; L Capello; A Diaz; T H Metzger; J Stangl; V Chamard
Journal: Nat Commun Date: 2011-11-29 Impact factor: 14.919

2. Coherent X-ray diffraction imaging of strain at the nanoscale.

Authors: Ian Robinson; Ross Harder
Journal: Nat Mater Date: 2009-04 Impact factor: 43.841

3. X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation.

Authors: Felix Hofmann; Brian Abbey; Wenjun Liu; Ruqing Xu; Brian F Usher; Eugeniu Balaur; Yuzi Liu
Journal: Nat Commun Date: 2013 Impact factor: 14.919

4. Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography.

Authors: S O Hruszkewycz; M V Holt; C E Murray; J Bruley; J Holt; A Tripathi; O G Shpyrko; I McNulty; M J Highland; P H Fuoss
Journal: Nano Lett Date: 2012-09-26 Impact factor: 11.189

Dislocation networks: Shedding coherent light on defects.

1. Three-dimensional high-resolution quantitative microscopy of extended crystals.

2. Coherent X-ray diffraction imaging of strain at the nanoscale.

3. X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation.

4. Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography.

5. High-resolution three-dimensional partially coherent diffraction imaging.

6. Strain imaging of nanoscale semiconductor heterostructures with x-ray Bragg projection ptychography.

7. Three-dimensional imaging of dislocation propagation during crystal growth and dissolution.

8. Strain in a silicon-on-insulator nanostructure revealed by 3D x-ray Bragg ptychography.