| Literature DB >> 26196991 |
Zhicheng Zhong1, Markus Wallerberger1, Jan M Tomczak1, Ciro Taranto1, Nicolaus Parragh2, Alessandro Toschi1, Giorgio Sangiovanni2, Karsten Held1.
Abstract
We employ density functional theory plus dynamical mean field theory and identify the physical origin of why two layers of SrVO(3) on a SrTiO(3) substrate are insulating: the thin film geometry lifts the orbital degeneracy, which in turn triggers a first-order Mott-Hubbard transition. Two layers of SrVO(3) are just at the verge of a Mott-Hubbard transition and hence ideally suited for technological applications of the Mott-Hubbard transition: the heterostructure is highly sensitive to strain, electric field, and temperature. A gate voltage can also switch between metal (ON) and insulator (OFF), so that a transistor with ideal ON-OFF switching properties is realized.Entities:
Year: 2015 PMID: 26196991 DOI: 10.1103/PhysRevLett.114.246401
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161