Accurate Extraction of Electrostatic Force by a Voltage-Pulse Force Spectroscopy.

The classification of interaction forces between two approaching bodies is important in a wide range of research fields. Here, we propose a method to unambiguously extract the electrostatic force (F(ele)), which is one of the most significant forces. This method is based on the measurement of the energy dissipation under applied voltage pulse between an atomic force microscopy (AFM) tip and sample. It allowed us to obtain F(ele) as a function of the tip-sample distance and voltage including the distance-independent part, to which conventional AFM is insensitive. The obtained F(ele) curves nicely fit the analytical model, enabling estimation of the geometry of the tip. The distance-dependent contact potential difference could also be correctly obtained by the measured F(ele), opening an alternative route to quantitative Kelvin probe force microscopy.