| Literature DB >> 26193454 |
Jui-Yuan Chen1, Chun-Wei Huang1, Chung-Hua Chiu1, Yu-Ting Huang1, Wen-Wei Wu1.
Abstract
The filament in aAu/Ta2 O5 /Au system is analyzed and determined to be a nanoscaled TaO2-x filament. A shrunken anode localizes the filament formation and the defect boundary leads to faster accumulation of oxygen vacancies. The defect changes the switching domination between electron transport and oxygen-vacancy migration. The migration of oxygen vacancies limits the filament dynamics, indicating the crucial role played by oxygen defects.Entities:
Keywords: in situ TEM; memristors; nanofilaments; resistive switching; valence change memories (VCM)
Year: 2015 PMID: 26193454 DOI: 10.1002/adma.201502758
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849