| Literature DB >> 26191767 |
Ken Tanizawa, Keijiro Suzuki, Munehiro Toyama, Minoru Ohtsuka, Nobuyuki Yokoyama, Kazuyuki Matsumaro, Miyoshi Seki, Keiji Koshino, Toshio Sugaya, Satoshi Suda, Guangwei Cong, Toshio Kimura, Kazuhiro Ikeda, Shu Namiki, Hitoshi Kawashima.
Abstract
We demonstrate a 32 × 32 path-independent-insertion-loss optical path switch that integrates 1024 thermooptic Mach-Zehnder switches and 961 intersections on a small, 11 × 25 mm2 die. The switch is fabricated on a 300-mm-diameter silicon-on-insulator wafer by a complementary metal-oxide semiconductor-compatible process with advanced ArF immersion lithography. For reliable electrical packaging, the switch chip is flip-chip bonded to a ceramic interposer that arranges the electrodes in a 0.5-mm pitch land grid array. The on-chip loss is measured to be 15.8 ± 1.0 dB, and successful switching is demonstrated for digital-coherent 43-Gb/s QPSK signals. The total crosstalk of the switch is estimated to be less than -20 dB at the center wavelength of 1545 nm. The bandwidth narrowing caused by dimensional errors that arise during fabrication is discussed.Entities:
Year: 2015 PMID: 26191767 DOI: 10.1364/OE.23.017599
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894