| Literature DB >> 26183904 |
Lifeng Wang1,2,3, Bin Wu3, Lili Jiang3, Jisi Chen3, Yongtao Li3, Wei Guo3, Pingan Hu1,2, Yunqi Liu3.
Abstract
The full spectrum from attachment-kinetic-dominated to diffusion-controlled modes is revealed for the cases of monolayer h-BN chemical vapor deposition (CVD) growth and Ar/H2 etching. The sets of grown and etched structures exhibit well-defined shape evolution from Euclidian to fractal geometry. The detailed abnormal processes for merging h-BN flakes into continuous structures or film are first observed and explained.Entities:
Keywords: chemical vapor deposition; diffusion; growth and etching; hexagonal boron nitride
Year: 2015 PMID: 26183904 DOI: 10.1002/adma.201501166
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849