| Literature DB >> 26177075 |
Thomas Dienel1, Shigeki Kawai2,3, Hajo Söde1, Xinliang Feng4,5, Klaus Müllen4, Pascal Ruffieux1, Roman Fasel1,6, Oliver Gröning1.
Abstract
We report on the structural characterization of junctions between atomically well-defined graphene nanoribbons (GNRs) by means of low-temperature, noncontact scanning probe microscopy. We show that the combination of simultaneously acquired frequency shift and tunneling current maps with tight binding (TB) simulations allows a comprehensive characterization of the atomic connectivity in the GNR junctions. The proposed approach can be generally applied to the investigation of graphene nanomaterials and their interconnections and is thus expected to become an important tool in the development of graphene-based circuitry.Entities:
Keywords: Two-dimensional material; graphene nanoribbon; nc-AFM; noncontact atomic force microscopy; scanning tunneling microscopy; tight binding
Year: 2015 PMID: 26177075 DOI: 10.1021/acs.nanolett.5b01403
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189