| Literature DB >> 26175897 |
Abstract
This Editorial surveys the current status and recent developments in the structural science of materials as exemplified by the articles recently published in IUCrJ.Entities:
Keywords: materials; structural science
Year: 2015 PMID: 26175897 PMCID: PMC4491309 DOI: 10.1107/S2052252515010891
Source DB: PubMed Journal: IUCrJ ISSN: 2052-2525 Impact factor: 4.769
Figure 1Diffraction patterns of benzil obtained from data recorded at the 11-ID-B beamline of the Advanced Photon Source (APS). (a) A single data frame recorded on a Perkin–Elmer amorphous silicon two-dimensional area detector using 58.26 keV X-rays (λ = 0.2127 Å). (b) The hk0 reciprocal section at 300 K, reconstructed from a data set comprising 740 such frames. (c) The same section recorded at 100 K. The maximum recorded was 8.52 Å−1. Note that the intensities in these images are displayed on a logarithmic scale. Reproduced from Welberry & Goossens (2014 ▸).
Figure 2BF TEM micrograph (a) of a 300 nm rod and SAED patterns (b, c, d) with the [010] zone of γ-form crystals within the 300 nm rods. The crystal growth direction in the long axis of the rod is shown along (b) the [200] direction and in between (c) the [200] and [20] and (d) the [01] and [001] directions. BF TEM micrograph (e) of a 65 nm rod and SAED patterns (f, g, h) with the [010] zone of γ-form crystals within the 65 nm rod. The crystal growth direction is shown in between (f) the [01] and [001], (g) the [200] and [20] and (h) the [01] and [001] directions. Dashed lines denote the long axis of the rod. Reproduced from Cao et al. (2014 ▸)