Literature DB >> 26133840

Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope.

Shingo Fukuda1, Takayuki Uchihashi1, Toshio Ando1.   

Abstract

In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner's fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α3β3 subcomplex of F1-ATPase in dynamic action at ∼7 frames/s.

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Year:  2015        PMID: 26133840     DOI: 10.1063/1.4922381

Source DB:  PubMed          Journal:  Rev Sci Instrum        ISSN: 0034-6748            Impact factor:   1.523


  1 in total

1.  Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head.

Authors:  Luke Oduor Otieno; Bernard Ouma Alunda; Jaehyun Kim; Yong Joong Lee
Journal:  Sensors (Basel)       Date:  2021-01-07       Impact factor: 3.576

  1 in total

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