| Literature DB >> 26076304 |
Yang Gao1, Suenne Kim2, Si Zhou3, Hsiang-Chih Chiu4, Daniel Nélias5, Claire Berger6, Walt de Heer7, Laura Polloni8, Roman Sordan8, Angelo Bongiorno9, Elisa Riedo1.
Abstract
Two-dimensional materials, such as graphene and MoS2, are films of a few atomic layers in thickness with strong in-plane bonds and weak interactions between the layers. The in-plane elasticity has been widely studied in bending experiments where a suspended film is deformed substantially; however, little is known about the films' elastic modulus perpendicular to the planes, as the measurement of the out-of-plane elasticity of supported 2D films requires indentation depths smaller than the films' interlayer distance. Here, we report on sub-ångström-resolution indentation measurements of the perpendicular-to-the-plane elasticity of 2D materials. Our indentation data, combined with semi-analytical models and density functional theory, are then used to study the perpendicular elasticity of few-layer-thick graphene and graphene oxide films. We find that the perpendicular Young's modulus of graphene oxide films reaches a maximum when one complete water layer is intercalated between the graphitic planes. This non-destructive methodology can map interlayer coupling and intercalation in 2D films.Entities:
Year: 2015 PMID: 26076304 DOI: 10.1038/nmat4322
Source DB: PubMed Journal: Nat Mater ISSN: 1476-1122 Impact factor: 43.841