| Literature DB >> 26055510 |
Dongdong Chen, Yuan Gao, Yiya Chen, Yang Ren1, Xiaogang Peng.
Abstract
Discrete nature of thickness and flat basal planes of two-dimensional (2D) nanostructures display unique diffraction features. Their origin was uncovered by a new analysis method of powder X-ray diffraction, which reveals thickness and lattice orientation of the 2D nanostructures. Results indicate necessity of adoption of a different unit cell from the corresponding bulk crystal with the same internal atomic packing. For CdSe 2D nanostructures with zinc blende atomic packing, pseudotetragonal lattices are adequate, instead of face-centered cubic.Entities:
Keywords: XRD; nanocrystals; simulation; thickness; two-dimensional; unit-cell
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Year: 2015 PMID: 26055510 DOI: 10.1021/acs.nanolett.5b00940
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189