| Literature DB >> 26055472 |
Youn Ho Park1, Ryong Ha, Tea-Eon Park, Sung Wook Kim, Dongjea Seo, Heon-Jin Choi.
Abstract
Single-crystal, Cu-doped In x Ga1 - x N nanowires were grown on GaN/Al2O3 substrates via a vapor-liquid-solid (VLS) mechanism using Ni/Au bi-catalysts. The typical diameter of the Cu:In x Ga1 - x N nanowires was 80 to 150 nm, with a typical length of hundreds of micrometers. The as-grown nanowires exhibited diamagnetism. After annealing, the nanowires exhibited ferromagnetism with saturation magnetic moments higher than 0.8 μB (1 μB × 10(-24) Am(2)) per Cu atom at room temperature by the measurements using a superconducting quantum interference device (SQUID) magnetometer. X-ray absorption and X-ray magnetic circular dichroism spectra at Cu L 2,3-edges indicated that the doped Cu had a local magnetic moment and that its electronic configuration was mainly 3d (9). It possessed a small trivalent component, and thus, the n-type behavior of electrical property is measured at room temperature.Entities:
Year: 2015 PMID: 26055472 PMCID: PMC4493842 DOI: 10.1186/1556-276X-10-3
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Figure 1SEM, EDS, and HRTEM images and SAED pattern of nanowires. (a) Typical SEM image of Cu-doped InGa1 - N nanowires. (b) EDS image of the nanowire. (c) HRTEM image and the SAED pattern (inset) of an 80-nm-diameter nanowire.
Figure 2Magnetic properties after rapid thermal annealing under a flow of N . The inset shows the magnetic properties of pure InGa1 - N nanowires, indicating diamagnetism.
Figure 3AXS spectra at the Cu -edge and XMCD data. (a) AXS spectra at the Cu L 2,3-edge for Cu-doped InGa1 - N measured at 300 K. The inset shows the AXS spectra at the Cu L 2,3-edge for reference CuO powder. (b) XMCD data showing the difference between the Cu L 2,3-edge AXS spectra for the different spin directions (ρ + and ρ -) of nanowires measured at 300 K.
Figure 4Scanning electron micrograph and results of electrical measurement. (a) Scanning electron micrograph of the electric device. The inset shows the close-up of the nanowire channel and the scale bar is 100 nm. (b) Results of electrical measurement with various V SD at 300 K.