Literature DB >> 26042937

Progress with molecular electronic junctions: meeting experimental challenges in design and fabrication.

Richard L McCreery1,2, Adam Johan Bergren3.   

Abstract

Molecular electronics seeks to incorporate molecular components as functional elements in electronic devices. There are numerous strategies reported to date for the fabrication, design, and characterization of such devices, but a broadly accepted example showing structure-dependent conductance behavior has not yet emerged. This progress report focuses on experimental methods for making both single-molecule and ensemble molecular junctions, and highlights key results from these efforts. Based on some general objectives of the field, particular experiments are presented to show progress in several important areas, and also to define those areas that still need attention. Some of the variable behavior of ostensibly similar junctions reported in the literature is attributable to differences in the way the junctions are fabricated. These differences are due, in part, to the multitude of methods for supporting the molecular layer on the substrate, including methods that utilize physical adsorption and covalent bonds, and to the numerous strategies for making top contacts. After discussing recent experimental progress in molecular electronics, an assessment of the current state of the field is presented, along with a proposed road map that can be used to assess progress in the future.
Copyright © 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim.

Keywords:  data storage; molecular electronics; molecular junctions; nanodevices; nanostructures

Year:  2009        PMID: 26042937     DOI: 10.1002/adma.200802850

Source DB:  PubMed          Journal:  Adv Mater        ISSN: 0935-9648            Impact factor:   30.849


  20 in total

1.  Charge transport in molecular electronic junctions: compression of the molecular tunnel barrier in the strong coupling regime.

Authors:  Sayed Y Sayed; Jerry A Fereiro; Haijun Yan; Richard L McCreery; Adam Johan Bergren
Journal:  Proc Natl Acad Sci U S A       Date:  2012-06-01       Impact factor: 11.205

2.  'Soft' Au, Pt and Cu contacts for molecular junctions through surface-diffusion-mediated deposition.

Authors:  Andrew P Bonifas; Richard L McCreery
Journal:  Nat Nanotechnol       Date:  2010-06-27       Impact factor: 39.213

3.  Does molecular electronics compute?

Authors: 
Journal:  Nat Nanotechnol       Date:  2013-06       Impact factor: 39.213

4.  The role of van der Waals forces in the performance of molecular diodes.

Authors:  Nisachol Nerngchamnong; Li Yuan; Dong-Chen Qi; Jiang Li; Damien Thompson; Christian A Nijhuis
Journal:  Nat Nanotechnol       Date:  2013-01-06       Impact factor: 39.213

5.  Memristive devices for computing.

Authors:  J Joshua Yang; Dmitri B Strukov; Duncan R Stewart
Journal:  Nat Nanotechnol       Date:  2013-01       Impact factor: 39.213

Review 6.  A Collective Study on Modeling and Simulation of Resistive Random Access Memory.

Authors:  Debashis Panda; Paritosh Piyush Sahu; Tseung Yuen Tseng
Journal:  Nanoscale Res Lett       Date:  2018-01-10       Impact factor: 4.703

7.  Porphyrins as Molecular Electronic Components of Functional Devices.

Authors:  Matthew Jurow; Amanda E Schuckman; James D Batteas; Charles Michael Drain
Journal:  Coord Chem Rev       Date:  2010-10-01       Impact factor: 22.315

Review 8.  From the bottom up: dimensional control and characterization in molecular monolayers.

Authors:  Shelley A Claridge; Wei-Ssu Liao; John C Thomas; Yuxi Zhao; Huan H Cao; Sarawut Cheunkar; Andrew C Serino; Anne M Andrews; Paul S Weiss
Journal:  Chem Soc Rev       Date:  2013-04-07       Impact factor: 54.564

9.  An MCBJ case study: The influence of π-conjugation on the single-molecule conductance at a solid/liquid interface.

Authors:  Wenjing Hong; Hennie Valkenier; Gábor Mészáros; David Zsolt Manrique; Artem Mishchenko; Alexander Putz; Pavel Moreno García; Colin J Lambert; Jan C Hummelen; Thomas Wandlowski
Journal:  Beilstein J Nanotechnol       Date:  2011-10-18       Impact factor: 3.649

10.  Bottom-electrode induced defects in self-assembled monolayer (SAM)-based tunnel junctions affect only the SAM resistance, not the contact resistance or SAM capacitance.

Authors:  C S Suchand Sangeeth; Li Jiang; Christian A Nijhuis
Journal:  RSC Adv       Date:  2018-05-30       Impact factor: 3.361

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