| Literature DB >> 26036263 |
Li He1, Pei Zhang1, Matthew F Besser2, Matthew Joseph Kramer2, Paul M Voyles1.
Abstract
Electron correlation microscopy (ECM) is a new technique that utilizes time-resolved coherent electron nanodiffraction to study dynamic atomic rearrangements in materials. It is the electron scattering equivalent of photon correlation spectroscopy with the added advantage of nanometer-scale spatial resolution. We have applied ECM to a Pd40Ni40P20 metallic glass, heated inside a scanning transmission electron microscope into a supercooled liquid to measure the structural relaxation time τ between the glass transition temperature T g and the crystallization temperature, T x . τ determined from the mean diffraction intensity autocorrelation function g 2(t) decreases with temperature following an Arrhenius relationship between T g and T g +25 K, and then increases as temperature approaches T x . The distribution of τ determined from the g 2(t) of single speckles is broad and changes significantly with temperature.Keywords: bulk metallic glass; electron correlation microscopy; fluctuation electron microscopy; scanning transmission electron microscopy; x-ray photon correlation spectroscopy
Year: 2015 PMID: 26036263 DOI: 10.1017/S1431927615000641
Source DB: PubMed Journal: Microsc Microanal ISSN: 1431-9276 Impact factor: 4.127