Literature DB >> 26030139

Nanoscale Probing of Local Electrical Characteristics on MBE-Grown Bi₂Te₃ Surfaces under Ambient Conditions.

Rita J Macedo1, Sara E Harrison2, Tatiana S Dorofeeva1, James S Harris2, Richard A Kiehl1.   

Abstract

The local electrical characteristics on the surface of MBE-grown Bi2Te3 are probed under ambient conditions by conductive atomic force microscopy. Nanoscale mapping reveals a 10-100× enhancement in current at step-edges compared to that on terraces. Analysis of the local current-voltage characteristics indicates that the transport mechanism is similar for step-edges and terraces. Comparison of the results with those for control samples shows that the current enhancement is not a measurement artifact but instead is due to local differences in electronic properties. The likelihood of various possible mechanisms is discussed. The absence of enhancement at the step-edges for graphite terraces is consistent with the intriguing possibility that spin-orbit coupling and topological effects play a significant role in the step-edge current enhancement in Bi2Te3.

Entities:  

Keywords:  Bismuth telluride; atomic force microscopy; molecular beam epitaxy; topological insulators; van der Waals epitaxy

Year:  2015        PMID: 26030139     DOI: 10.1021/acs.nanolett.5b00542

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  1 in total

1.  Imaging current distribution in a topological insulator Bi2Se3 in the presence of competing surface and bulk contributions to conductivity.

Authors:  Amit Jash; Ankit Kumar; Sayantan Ghosh; A Bharathi; S S Banerjee
Journal:  Sci Rep       Date:  2021-04-02       Impact factor: 4.379

  1 in total

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