Literature DB >> 26029391

Crystal structure of bis-(fluoro-sulfato-κO)xenon(II), Xe(SO3F)2.

Moritz Malischewski1, Konrad Seppelt1.   

Abstract

Thermally unstable Xe(SO3F)2 has been prepared by the reaction of XeF2 with HSO3F. Single crystals were obtained from HSO3F by slow cooling in a sealed tube. The mol-ecular structure is characterized by the Xe atom covalently bonded to two O atoms of two fluoro-sulfate tetra-hedra in an almost linear fashion [O-Xe-O = 179.13 (4)°]. The crystal packing is strongly influenced by inter-molecular van der Waals forces.

Entities:  

Keywords:  crystal structure; fluoro­sulfate; noble gas; oxidizer; superacid; xenon; xenon–oxygen compound

Year:  2015        PMID: 26029391      PMCID: PMC4438818          DOI: 10.1107/S2056989015004788

Source DB:  PubMed          Journal:  Acta Crystallogr E Crystallogr Commun


Chemical context

In 1972, Neil Bartlett published data on the unit cell of Xe(SO3F)2 (Wechsberg et al., 1972 ▸). As a result of the thermal instability of this compound, no further structural details were given at that time, but 19F and 129Xe NMR spectra were reported subsequently (Gillespie et al., 1974 ▸; Schrobilgen et al., 1978 ▸). The decomposition of Xe(SO3F)2 leads cleanly to Xe and S2O6F2.

Structural commentary

Analogous to XeF2 (Agron et al., 1963 ▸), the two-coordinated xenon atom adopts a linear geometry [angle O1—Xe—O4 = 179.13 (4)°]. The mol­ecule has nearly C symmetry, with the xenon atom at the pseudo-inversion centre (Fig. 1 ▸). This finding is in contrast to earlier reports, where C symmetry was discussed based on Raman spectroscopic data (Gillespie & Landa, 1973 ▸). The Xe—O bonds are 2.1101 (13) and 2.1225 (13) Å, which is typical for Xe—O single bonds, whereas Xe=O double bonds are considerably shorter with lengths ≃ 1.75 Å. The related compound xenon fluoride fluoro­sulfate, XeF(OSO2F) (Bartlett et al., 1969 ▸, 1972 ▸), contains a Xe—O bond that is slightly longer [2.155 (8) Å] than in the title compound, but the Xe—F bond of XeF(OSO2F) is at 1.940 (8) Å shorter than that in XeF2 (2.00 Å). For XeF(OSO2F), partial ionic bonding (XeF+·OSO2F−) was discussed. Obviously, both XeF2 and Xe(SO3F)2 have a higher covalent character. The S—O bonds in Xe(SO3F)2 involving the O atoms that are also bonded to the xenon atom (S1—O1 and S2—O4) are about 0.1 Å longer than the terminal S—O bonds (Table 1 ▸), indicating partial double-bond character.
Figure 1

The mol­ecular structure of the title compound, with displacement ellipsoids drawn at the 50% probability level.

Table 1

Selected geometric parameters (, )

Xe1O12.1101(13)S1F11.5449(12)
Xe1O42.1225(13)S2O61.4141(13)
S1O31.4103(13)S2O51.4150(14)
S1O21.4092(14)S2O41.5237(13)
S1O11.5334(13)S2F21.5483(12)
    
O1Xe1O4179.13(4)  

Supra­molecular features

The crystal packing (Fig. 2 ▸) is strongly influenced by inter­molecular van der Waals inter­actions to seven oxygen atoms and two fluorine atoms (Table 2 ▸). Whereas the xenon atom in XeF2 exhibits inter­molecular inter­actions to eight fluorine atoms (distance 3.42 Å; Agron et al., 1963 ▸), XeF(OSO2F) has fewer contacts (five contacts to oxygen in the range 3.28–3.49 Å and one contact to fluorine of 3.39 Å; Bartlett et al., 1972 ▸).
Figure 2

The crystal packing of the title compound

Table 2

Intermolecular contacts ()

Xe1O23.1613(15)Xe1F1iv 3.4551(17)
Xe1O53.1855(16)Xe1O3v 3.4707(19)
Xe1O2i 3.1872(17)Xe1O5vi 3.4818(18)
Xe1O6ii 3.2317(19)Xe1F2vii 3.5867(17)
Xe1O6iii 3.3262(18)  

Symmetry codes: (i) ; (ii) ; (iii) ; (iv) ; (v) ; (vi) ; (vii) .

Synthesis and crystallization

550 mg fluoro­sulfuric acid were placed in a 8 mm PFA tube. 170 mg (1 mmol) of XeF2 were added and the mixture vigorously shaken at room temperature for some minutes until all XeF2 had dissolved. The PFA tube was evacuated for some seconds to remove HF, then frozen with liquid nitro­gen and sealed. The yellow product (≃ 0.2 ml) was warmed to 273 K and the PFA tube placed in a dewar filled with 273 K ethanol and cooled slowly to 193 K in a freezer. The light-yellow single crystals of Xe(SO3F)2 that had formed were deca­nted off and mounted in a cold nitro­gen stream. At 100 K, the crystals are colorless. The compound decomposes rapidly in moist air and can ignite organic materials.

Refinement details

Crystal data, data collection and structure refinement details are summarized in Table 3 ▸.
Table 3

Experimental details

Crystal data
Chemical formula[Xe(SO3F)2]
M r 329.42
Crystal system, space groupMonoclinic, P21/n
Temperature (K)100
a, b, c ()6.706(3), 13.237(6), 7.769(3)
()96.50(3)
V (3)685.2(5)
Z 4
Radiation typeMo K
(mm1)5.66
Crystal size (mm)0.50 0.40 0.15
 
Data collection
DiffractometerBruker CCD SMART 2000
Absorption correctionMulti-scan (SADABS; Bruker, 2006)
T min, T max 0.545, 1.000
No. of measured, independent and observed [I > 2(I)] reflections11036, 2096, 1978
R int 0.020
(sin /)max (1)0.716
 
Refinement
R[F 2 > 2(F 2)], wR(F 2), S 0.013, 0.033, 1.11
No. of reflections2096
No. of parameters101
max, min (e 3)0.56, 0.69

Computer programs: SMART and SAINT (Bruker, 2006 ▸), SHELXS97, SHELXL and SHELXTL (Sheldrick, 2008 ▸), ORTEP-3 for Windows (Farrugia, 2012 ▸) and DIAMOND (Brandenburg, 1999 ▸).

Crystal structure: contains datablock(s) I. DOI: 10.1107/S2056989015004788/wm5134sup1.cif Structure factors: contains datablock(s) I. DOI: 10.1107/S2056989015004788/wm5134Isup2.hkl CCDC reference: 1052852 Additional supporting information: crystallographic information; 3D view; checkCIF report
[Xe(SO3F)2]F(000) = 608
Mr = 329.42Dx = 3.194 Mg m3
Monoclinic, P21/nMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ynCell parameters from 999 reflections
a = 6.706 (3) Åθ = 2.0–21.0°
b = 13.237 (6) ŵ = 5.66 mm1
c = 7.769 (3) ÅT = 100 K
β = 96.50 (3)°Irregular, colorless
V = 685.2 (5) Å30.50 × 0.40 × 0.15 mm
Z = 4
Bruker CCD SMART 2000 diffractometer2096 independent reflections
Radiation source: fine-focus sealed tube1978 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.020
ω scansθmax = 30.6°, θmin = 3.1°
Absorption correction: multi-scan (SADABS; Bruker, 2006)h = −9→8
Tmin = 0.545, Tmax = 1.000k = −18→18
11036 measured reflectionsl = −11→9
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.013w = 1/[σ2(Fo2) + (0.0151P)2 + 0.4262P] where P = (Fo2 + 2Fc2)/3
wR(F2) = 0.033(Δ/σ)max = 0.002
S = 1.11Δρmax = 0.56 e Å3
2096 reflectionsΔρmin = −0.69 e Å3
101 parametersExtinction correction: SHELXL (Sheldrick, 2008), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
0 restraintsExtinction coefficient: 0.0244 (5)
Geometry. All s.u.'s (except the s.u. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell s.u.'s are taken into account individually in the estimation of s.u.'s in distances, angles and torsion angles; correlations between s.u.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell s.u.'s is used for estimating s.u.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > 2σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
Xe10.000928 (13)0.627394 (6)0.726096 (13)0.01145 (4)
S1−0.33404 (6)0.46260 (3)0.75371 (5)0.01295 (8)
S20.32649 (6)0.79932 (3)0.70775 (5)0.01265 (8)
O40.24243 (18)0.72199 (8)0.82568 (16)0.0155 (2)
F20.51324 (16)0.74159 (8)0.65972 (16)0.0227 (2)
O2−0.22016 (19)0.45699 (9)0.91739 (17)0.0190 (2)
F1−0.52083 (16)0.52658 (9)0.78020 (16)0.0255 (2)
O60.4027 (2)0.88225 (8)0.80947 (18)0.0181 (2)
O50.2017 (2)0.81316 (9)0.55006 (17)0.0202 (3)
O3−0.4069 (2)0.37545 (9)0.6629 (2)0.0218 (3)
O1−0.23650 (18)0.53141 (9)0.62828 (16)0.0168 (2)
U11U22U33U12U13U23
Xe10.01151 (6)0.01094 (6)0.01174 (7)−0.00098 (3)0.00068 (3)0.00171 (3)
S10.01200 (16)0.01179 (15)0.0150 (2)−0.00106 (12)0.00137 (13)0.00063 (13)
S20.01379 (17)0.01185 (15)0.01261 (19)−0.00147 (12)0.00274 (13)−0.00024 (13)
O40.0159 (5)0.0156 (5)0.0143 (6)−0.0052 (4)−0.0010 (4)0.0026 (4)
F20.0194 (5)0.0234 (5)0.0268 (6)0.0023 (4)0.0093 (4)−0.0049 (4)
O20.0216 (6)0.0210 (5)0.0141 (6)−0.0027 (5)0.0004 (5)0.0033 (5)
F10.0158 (5)0.0232 (5)0.0382 (7)0.0055 (4)0.0064 (5)−0.0005 (5)
O60.0221 (6)0.0147 (5)0.0181 (7)−0.0052 (4)0.0047 (5)−0.0038 (4)
O50.0240 (6)0.0219 (6)0.0141 (6)−0.0038 (5)−0.0006 (5)0.0044 (5)
O30.0243 (6)0.0164 (6)0.0248 (8)−0.0070 (4)0.0026 (5)−0.0041 (5)
O10.0167 (5)0.0191 (5)0.0139 (6)−0.0064 (4)−0.0022 (4)0.0033 (4)
Xe1—O12.1101 (13)S1—F11.5449 (12)
Xe1—O42.1225 (13)S2—O61.4141 (13)
S1—O31.4103 (13)S2—O51.4150 (14)
S1—O21.4092 (14)S2—O41.5237 (13)
S1—O11.5334 (13)S2—F21.5483 (12)
Xe1···O23.1613 (15)Xe1···F1iv3.4551 (17)
Xe1···O53.1855 (16)Xe1···O3v3.4707 (19)
Xe1···O2i3.1872 (17)Xe1···O5vi3.4818 (18)
Xe1···O6ii3.2317 (19)Xe1···F2vii3.5867 (17)
Xe1···O6iii3.3262 (18)
O1—Xe1—O4179.13 (4)O6—S2—O4108.69 (8)
O3—S1—O2122.00 (8)O5—S2—O4112.64 (8)
O3—S1—O1108.46 (8)O6—S2—F2105.47 (8)
O2—S1—O1112.23 (7)O5—S2—F2105.68 (8)
O3—S1—F1105.94 (8)O4—S2—F2100.24 (7)
O2—S1—F1105.86 (8)S2—O4—Xe1119.74 (7)
O1—S1—F199.77 (7)S1—O1—Xe1119.18 (7)
O6—S2—O5121.62 (8)
  2 in total

1.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

2.  Xenon Difluoride and the Nature of the Xenon-Fluorine Bond.

Authors:  P A Agron; G M Begun; H A Levy; A A Mason; C G Jones; D F Smith
Journal:  Science       Date:  1963-03-01       Impact factor: 47.728

  2 in total

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