Literature DB >> 26025209

The correction of electron lens aberrations.

P W Hawkes1.   

Abstract

The progress of electron lens aberration correction from about 1990 onwards is chronicled. Reasonably complete lists of publications on this and related topics are appended. A present for Max Haider and Ondrej Krivanek in the year of their 65th birthdays. By a happy coincidence, this review was completed in the year that both Max Haider and Ondrej Krivanek reached the age of 65. It is a pleasure to dedicate it to the two leading actors in the saga of aberration corrector design and construction. They would both wish to associate their colleagues with such a tribute but it is the names of Haider and Krivanek (not forgetting Joachim Zach) that will remain in the annals of electron optics, next to that of Harald Rose. I am proud to know that both regard me as a friend as well as a colleague.
Copyright © 2015 Elsevier B.V. All rights reserved.

Keywords:  CEOS; Electron lens aberration correction; Nion; Quadrupoles; Scanning transmission electron microscope (STEM); Sextupoles; Transmission electron microscope (TEM)

Year:  2015        PMID: 26025209     DOI: 10.1016/j.ultramic.2015.03.007

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  4 in total

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Authors:  Airton Pereira E Silva; Sylvia Maria Nicolau Campos; Isabelle Mazza Guimarães; Gerlinde Agate Platais Brasil Teixeira
Journal:  Biomed Rep       Date:  2017-07-21

Review 2.  A Comprehensive Review on the Synthesis, Characterization, and Biomedical Application of Platinum Nanoparticles.

Authors:  Muniyandi Jeyaraj; Sangiliyandi Gurunathan; Muhammad Qasim; Min-Hee Kang; Jin-Hoi Kim
Journal:  Nanomaterials (Basel)       Date:  2019-12-02       Impact factor: 5.076

Review 3.  High resolution single particle Cryo-EM refinement using JSPR.

Authors:  Chen Sun; Brenda Gonzalez; Frank S Vago; Wen Jiang
Journal:  Prog Biophys Mol Biol       Date:  2020-07-03       Impact factor: 3.667

4.  Ewald sphere correction using a single side-band image processing algorithm.

Authors:  Christopher J Russo; Richard Henderson
Journal:  Ultramicroscopy       Date:  2018-01-12       Impact factor: 2.689

  4 in total

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