| Literature DB >> 26004522 |
Z Chen1, A J D'Alfonso2, M Weyland3, D J Taplin1, L J Allen2, S D Findlay4.
Abstract
We demonstrate absolute scale agreement between the number of X-ray counts in energy dispersive X-ray spectroscopy using an atomic-scale coherent electron probe and first-principles simulations. Scan-averaged spectra were collected across a range of thicknesses with precisely determined and controlled microscope parameters. Ionization cross-sections were calculated using the quantum excitation of phonons model, incorporating dynamical (multiple) electron scattering, which is seen to be important even for very thin specimens.Entities:
Keywords: Energy dispersive X-ray (EDX) spectroscopy; Scanning transmission electron microscopy (STEM)
Year: 2015 PMID: 26004522 DOI: 10.1016/j.ultramic.2015.05.010
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689