| Literature DB >> 25958846 |
Norma K Minar1, Kun Hou1, Christian Westermeier2, Markus Döblinger1, Jörg Schuster1, Fabian C Hanusch1, Bert Nickel2, Geoffrey A Ozin3, Thomas Bein4.
Abstract
A highly-ordered 3D covalent fullerene framework is presented with a structure based on octahedrally functionalized fullerene building blocks in which every fullerene is separated from the next by six functional groups and whose mesoporosity is controlled by cooperative self-assembly with a liquid-crystalline block copolymer. The new fullerene-framework material was obtained in the form of supported films by spin coating the synthesis solution directly on glass or silicon substrates, followed by a heat treatment. The fullerene building blocks coassemble with a liquid-crystalline block copolymer to produce a highly ordered covalent fullerene framework with orthorhombic Fmmm symmetry, accessible 7.5 nm pores, and high surface area, as revealed by gas adsorption, NMR spectroscopy, small-angle X-ray scattering (SAXS), and TEM. We also note that the 3D covalent fullerene framework exhibits a dielectric constant significantly lower than that of the nonporous precursor material.Entities:
Keywords: covalent frameworks; electron mobility; fullerenes; mesoporous materials; self-assembly
Year: 2015 PMID: 25958846 PMCID: PMC4510781 DOI: 10.1002/anie.201411344
Source DB: PubMed Journal: Angew Chem Int Ed Engl ISSN: 1433-7851 Impact factor: 15.336
Scheme 1Synthesis of the hexafunctionalized fullerene by DMA templating and further cyclopropanation with silane malonates.
Figure 1SAXS patterns of thin films of a highly ordered fullerene framework showing patterns for a) the as-synthesized film, b) the film after 18 h at 100 °C and solvent extraction, and c) the film after 18 h at 100 °C, solvent extraction, and 1 h under a nitrogen atmosphere at 300 °C.
Figure 2TEM images of the fullerene-framework film (190 nm thick) thermally treated at 300 °C under N2 for 1 h. a) Cross-section image, viewed along the [100] direction, of the orthorhombic structure with Fmmm symmetry. The lattice planes perpendicular and parallel to the substrate with measured distances of 6.9 and 11 nm can be indexed as (020) and (002), respectively. b) 2D Fourier transform of the TEM image in (a). c) Representation of the orientational relationship of the orthorhombic structure and the substrate viewed along [100]. d) Plan-view image in [010] orientation, showing large, highly ordered domains. The d values of 11 nm and 7.9 nm are in good agreement with the lattice plane distances of (002) and (200), respectively. e) 2D Fourier transform of the largest domain of (d). f) Expanded version (5×) of the TEM image in (d) on the left side.
Figure 3Nitrogen physisorption isotherms of the template extracted fullerene framework. Inset: the fitted pore-size distribution. STP= standard temperature and pressure.
Figure 4Characterization of the electronic properties by field-effect mobility and impedance measurements. a) Field-effect measurements of three different samples in thin-film transistor geometry. The main graph shows transconductance curves of a monoadduct (○), a hexa-adduct without silane groups (▵), and a C60-framework film (□) at VSD=20 V. The VTh value refers to the monoadduct. The data of the C60 framework are shifted by −6 nA for clarity. Inset in (a): conductance curves of the monoadduct-based device. b) Dielectric constant values over a broad frequency range obtained by impedance measurements on sandwich-type devices (see inset). By introducing mesoporosity, the dielectric constant for the extracted fullerene-framework film is lowered by 1.0 compared to a dense fullerene film.