| Literature DB >> 25918450 |
Jelena Lovrić1, Jacqueline D Keighron1, Tina B Angerer2, Xianchan Li1, Per Malmberg1, John S Fletcher2, Andrew G Ewing3.
Abstract
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects due to its high spatial resolution imaging capabilities and chemical specificity. In this work we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two phase system (ATPS)-containing liposomes. Characterization of the internal structure of single fixed liposomes was done both with the Bi3+ and C60+ ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.Entities:
Keywords: ToF-SIMS; aqueous two phase system; depth profile analysis; histamine; imaging; liposome
Year: 2014 PMID: 25918450 PMCID: PMC4408321 DOI: 10.1002/sia.5623
Source DB: PubMed Journal: Surf Interface Anal ISSN: 0142-2421 Impact factor: 1.607