| Literature DB >> 25861667 |
Christian M Hammer1, Tilman E Schäffer2.
Abstract
Entities:
Keywords: Atomic Force Microscopy; Eye Disease; Interdisciplinary Eye Research
Year: 2015 PMID: 25861667 PMCID: PMC4389290
Source DB: PubMed Journal: Med Hypothesis Discov Innov Ophthalmol ISSN: 2322-3219
Figure 1Simplified schematic of the setup of an atomic force microscope (with kind permission of Asylum Research, Santa Barbara, CA, USA). The topography of the sample is scanned with a cantilever tip and recorded by a computer. Cantilever deflection is measured with a laser beam reflected from the cantilever’s back. B: Principle of nanoindentation measurement. If the cantilever is pressed upon a soft sample (left), it will markedly indent the sample, but deflect only moderately. The converse is the case with a stiff sample (right).