| Literature DB >> 25836137 |
Sandeep Inampudi, Nicholas Kuhta, Viktor A Podolskiy.
Abstract
We present an imaging technique that allows the recovery of the profile of wavelength-scale objects with deep subwavelength resolution based on far-field intensity measurements. The approach, interscale mixing microscopy (IMM), relies on diffractive elements positioned in the near-field proximity of an object in order to scatter information carried by evanescent waves into propagating part of the spectrum. A combination of numerical solutions of Maxwell equations and nonlinear fitting is then used to recover the information about the object based on far-field intensity measurements. It is demonstrated that IMM has the potential to recover wavelength/20 features of wavelength-scale objects in the presence of 10% noise.Year: 2015 PMID: 25836137 DOI: 10.1364/OE.23.002753
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894