Literature DB >> 25831307

Fast-beam self-trapping in LiNbO(3) films by pyroelectric effect.

Mathieu Chauvet, Florent Bassignot, Fabien Henrot, Fabrice Devaux, Ludovic Gauthier-Manuel, Hervé Maillotte, Gwenn Ulliac, Ballandras Sylvain.   

Abstract

We report light-beam self-trapping triggered by the pyroelectric effect in an isolated ferroelectric thin film. Experiments are performed in an 8-μm-thick congruent undoped LiNbO(3) film bonded onto a silicon wafer. Response time two orders of magnitude faster than in bulk LiNbO(3) is reported. The original underlying physics specific of this arrangement is discussed.

Entities:  

Year:  2015        PMID: 25831307     DOI: 10.1364/OL.40.001258

Source DB:  PubMed          Journal:  Opt Lett        ISSN: 0146-9592            Impact factor:   3.776


  1 in total

1.  The Wafer-Level Integration of Single-Crystal LiNbO3 on Silicon via Polyimide Material.

Authors:  Xiangyu Yang; Wenping Geng; Kaixi Bi; Linyu Mei; Yaqing Li; Jian He; Jiliang Mu; Xiaojuan Hou; Xiujian Chou
Journal:  Micromachines (Basel)       Date:  2021-01-09       Impact factor: 2.891

  1 in total

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