Literature DB >> 25807151

van der Waals epitaxial growth of atomically thin Bi₂Se₃ and thickness-dependent topological phase transition.

Shuigang Xu1, Yu Han1, Xiaolong Chen1, Zefei Wu1, Lin Wang1,2, Tianyi Han1, Weiguang Ye1, Huanhuan Lu1, Gen Long1, Yingying Wu1, Jiangxiazi Lin1, Yuan Cai1, K M Ho1, Yuheng He1, Ning Wang1.   

Abstract

Two-dimensional (2D) atomic-layered heterostructures stacked by van der Waals interactions recently introduced new research fields, which revealed novel phenomena and provided promising applications for electronic, optical, and optoelectronic devices. In this study, we report the van der Waals epitaxial growth of high-quality atomically thin Bi2Se3 on single crystalline hexagonal boron nitride (h-BN) by chemical vapor deposition. Although the in-plane lattice mismatch between Bi2Se3 and h-BN is approximately 65%, our transmission electron microscopy analysis revealed that Bi2Se3 single crystals epitaxially grew on h-BN with two commensurate states; that is, the (1̅21̅0) plane of Bi2Se3 was preferably parallel to the (1̅100) or (1̅21̅0) plane of h-BN. In the case of the Bi2Se3 (2̅110) ∥ h-BN (11̅00) state, the Moiré pattern wavelength in the Bi2Se3/h-BN superlattice can reach 5.47 nm. These naturally formed thin crystals facilitated the direct assembly of h-BN/Bi2Se3/h-BN sandwiched heterostructures without introducing any impurity at the interfaces for electronic property characterization. Our quantum capacitance (QC) measurements showed a compelling phenomenon of thickness-dependent topological phase transition, which was attributed to the coupling effects of two surface states from Dirac Fermions at/or above six quintuple layers (QLs) to gapped Dirac Fermions below six QLs. Moreover, in ultrathin Bi2Se3 (e.g., 3 QLs), we observed the midgap states induced by intrinsic defects at cryogenic temperatures. Our results demonstrated that QC measurements based on h-BN/Bi2Se3/h-BN sandwiched structures provided rich information regarding the density of states of Bi2Se3, such as quantum well states and Landau quantization. Our approach in fabricating h-BN/Bi2Se3/h-BN sandwiched device structures through the combination of bottom-up growth and top-down dry transferring techniques can be extended to other two-dimensional layered heterostructures.

Entities:  

Keywords:  Moiré pattern; Topological insulators; midgap states; quantum capacitance; topological phase transition; van der Waals epitaxy

Year:  2015        PMID: 25807151     DOI: 10.1021/acs.nanolett.5b00247

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  5 in total

1.  Moiré superlattices at the topological insulator Bi2Te3.

Authors:  Koen Schouteden; Zhe Li; Taishi Chen; Fengqi Song; Bart Partoens; Chris Van Haesendonck; Kyungwha Park
Journal:  Sci Rep       Date:  2016-02-08       Impact factor: 4.379

2.  Tunable and laser-reconfigurable 2D heterocrystals obtained by epitaxial stacking of crystallographically incommensurate Bi2Se3 and MoS2 atomic layers.

Authors:  Anthony Vargas; Fangze Liu; Christopher Lane; Daniel Rubin; Ismail Bilgin; Zachariah Hennighausen; Matthew DeCapua; Arun Bansil; Swastik Kar
Journal:  Sci Adv       Date:  2017-07-14       Impact factor: 14.136

3.  Evolution of Moiré Profiles from van der Waals Superstructures of Boron Nitride Nanosheets.

Authors:  Yunlong Liao; Wei Cao; John W Connell; Zhongfang Chen; Yi Lin
Journal:  Sci Rep       Date:  2016-05-18       Impact factor: 4.379

4.  Ordered Peierls distortion prevented at growth onset of GeTe ultra-thin films.

Authors:  Ruining Wang; Davide Campi; Marco Bernasconi; Jamo Momand; Bart J Kooi; Marcel A Verheijen; Matthias Wuttig; Raffaella Calarco
Journal:  Sci Rep       Date:  2016-09-09       Impact factor: 4.379

5.  Atomic-Scale Deformations at the Interface of a Mixed-Dimensional van der Waals Heterostructure.

Authors:  Kimmo Mustonen; Aqeel Hussain; Christoph Hofer; Mohammad R A Monazam; Rasim Mirzayev; Kenan Elibol; Patrik Laiho; Clemens Mangler; Hua Jiang; Toma Susi; Esko I Kauppinen; Jani Kotakoski; Jannik C Meyer
Journal:  ACS Nano       Date:  2018-07-23       Impact factor: 15.881

  5 in total

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