| Literature DB >> 25789878 |
Nan Yang1,2,3, Claudia Cantoni4, Vittorio Foglietti1,5, Antonello Tebano1,2,5, Alex Belianinov6, Evgheni Strelcov6, Stephen Jesse6, Daniele Di Castro1,5, Elisabetta Di Bartolomeo2,7, Silvia Licoccia2,7, Sergei V Kalinin6, Giuseppe Balestrino1,5, Carmela Aruta1,2,5.
Abstract
Yttrium-doped barium zirconate (BZY) thin films recently showed surprising electric transport properties. Experimental investigations conducted mainly by electrochemical impedance spectroscopy suggested that a consistent part of this BZY conductivity is of protonic nature. These results have stimulated further investigations by local unconventional techniques. Here, we use electrochemical strain microscopy (ESM) to detect electrochemical activity in BZY films with nanoscale resolution. ESM in a novel cross-sectional measuring setup allows the direct visualization of the interfacial activity. The local electrochemical investigation is compared with the structural studies performed by state of art scanning transmission electron microscopy (STEM). The ESM and STEM results show a clear correlation between the conductivity and the interface structural defects. We propose a physical model based on a misfit dislocation network that introduces a novel 2D transport phenomenon, whose fingerprint is the low activation energy measured.Entities:
Keywords: SPM; STEM; doped barium zirconate; electrolytes; interface defects; ionic conduction; perovskite oxide thin films
Year: 2015 PMID: 25789878 DOI: 10.1021/acs.nanolett.5b00698
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189