| Literature DB >> 25740351 |
Konstantin B Borisenko1, Janaki Shanmugam1, Benjamin A O Williams2, Paul Ewart2, Behrad Gholipour3, Daniel W Hewak3, Rohanah Hussain4, Tamás Jávorfi4, Giuliano Siligardi4, Angus I Kirkland1.
Abstract
We demonstrate that optical activity in amorphous isotropic thin films of pure Ge2Sb2Te5 and N-doped Ge2Sb2Te5N phase-change memory materials can be induced using rapid photo crystallisation with circularly polarised laser light. The new anisotropic phase transition has been confirmed by circular dichroism measurements. This opens up the possibility of controlled induction of optical activity at the nanosecond time scale for exploitation in a new generation of high-density optical memory, fast chiroptical switches and chiral metamaterials.Entities:
Year: 2015 PMID: 25740351 PMCID: PMC4350098 DOI: 10.1038/srep08770
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1CD spectra from pure and N-doped GST films.
(a) Single CD spectra of pure GST thin film crystallised by pulses of L-CPL and R-CPL together with averaged spectrum from amorphous regions (GST AMORPH). Error bars show standard deviations from five repeated measurements. (b) Double CD spectra of N-doped GST thin film crystallised by pulses of L-CPL and R-CPL together with the averaged double CD spectrum from amorphous regions (NGST AMORPH). Error bars show standard deviations from five repeated measurements.
Figure 2Proposed mechanisms of the induced CD signal.
(a) A schematical illustration of alignment of individual crystallites along polarisation vector as circularly polarised light propagates through the material. The illustrated crystallites form a chiral crystallite cluster thought responsible for the observed CD signal. (b) Chiral atomic structural motifs proposed to contribute to the observed chiral signal in NGST.
Figure 3Measurements of the CD spectra.
(a) Sample chamber at circular dichroism beamline B23 module B. (b) Sample chamber without the lid showing the holder that allows vertical and horizontal movement of the sample. (c) Fused silica disk sample coated with a thin film of GST showing two crystallised areas (the crystallised area in the centre of the sample was used for measurements of the CD spectra). (d) Beam profile of the beam at B23 module B measured at the sample plane using the beam profile monitor Beamage USB.