Literature DB >> 25732228

Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique.

Maxwell W Terban1, Matthew Johnson, Marco Di Michiel, Simon J L Billinge.   

Abstract

Difference atomic pair distribution function methods have been applied to detect and characterize nanoparticles suspended in a solvent at very dilute concentrations. We specifically consider nanoparticles of a pharmaceutical compound in aqueous solution using X-ray PDF methods, a challenging case due to the low atomic number of the nanoparticle species. The nanoparticles were unambiguously detected at the level of 0.25 wt%. Even at these low concentrations the signals were highly reproducible, allowing for reliable detection and quantitative analysis of the nanoparticle structure.

Entities:  

Year:  2015        PMID: 25732228     DOI: 10.1039/c4nr06486k

Source DB:  PubMed          Journal:  Nanoscale        ISSN: 2040-3364            Impact factor:   7.790


  6 in total

1.  The rise of the X-ray atomic pair distribution function method: a series of fortunate events.

Authors:  Simon J L Billinge
Journal:  Philos Trans A Math Phys Eng Sci       Date:  2019-06-17       Impact factor: 4.226

2.  Structural evolution in thermoelectric zinc antimonide thin films studied by in situ X-ray scattering techniques.

Authors:  Lirong Song; Martin Roelsgaard; Anders B Blichfeld; Ann-Christin Dippel; Kirsten Marie Ørnsbjerg Jensen; Jiawei Zhang; Bo B Iversen
Journal:  IUCrJ       Date:  2021-04-13       Impact factor: 4.769

Review 3.  Structural Analysis of Molecular Materials Using the Pair Distribution Function.

Authors:  Maxwell W Terban; Simon J L Billinge
Journal:  Chem Rev       Date:  2021-11-17       Impact factor: 60.622

4.  Time-resolved pair distribution function analysis of disordered materials on beamlines BL04B2 and BL08W at SPring-8.

Authors:  Koji Ohara; Satoshi Tominaka; Hiroki Yamada; Masakuni Takahashi; Hiroshi Yamaguchi; Futoshi Utsuno; Takashi Umeki; Atsushi Yao; Kengo Nakada; Michitaka Takemoto; Satoshi Hiroi; Naruki Tsuji; Toru Wakihara
Journal:  J Synchrotron Radiat       Date:  2018-09-26       Impact factor: 2.616

Review 5.  There's no place like real-space: elucidating size-dependent atomic structure of nanomaterials using pair distribution function analysis.

Authors:  Troels Lindahl Christiansen; Susan R Cooper; Kirsten M Ø Jensen
Journal:  Nanoscale Adv       Date:  2020-05-06

6.  Demonstration of thin film pair distribution function analysis (tfPDF) for the study of local structure in amorphous and crystalline thin films.

Authors:  Kirsten M Ø Jensen; Anders B Blichfeld; Sage R Bauers; Suzannah R Wood; Eric Dooryhée; David C Johnson; Bo B Iversen; Simon J L Billinge
Journal:  IUCrJ       Date:  2015-07-05       Impact factor: 4.769

  6 in total

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