| Literature DB >> 25723926 |
Lorenzo Galli1, Sang Kil Son1, Thomas A White1, Robin Santra1, Henry N Chapman1, Max H Nanao2.
Abstract
Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation-damage-induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free-electron laser facilities.Entities:
Keywords: SFX; X-ray FEL; phasing; radiation damage
Mesh:
Substances:
Year: 2015 PMID: 25723926 DOI: 10.1107/S1600577514027854
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616