| Literature DB >> 25714126 |
Magnus Heurlin1, Tomaš Stankevič2, Simas Mickevičius2, Sofie Yngman1, David Lindgren1, Anders Mikkelsen1, Robert Feidenhans'l2, Magnus T Borgström1, Lars Samuelson1.
Abstract
We report on growth and characterization of wurtzite InP-In(1-x)Ga(x)As core-shell nanowire heterostructures. A range of nanowire structures with different Ga concentration in the shell was characterized with transmission electron microscopy and X-ray diffraction. We found that the main part of the nanowires has a pure wurtzite crystal structure, with occasional stacking faults occurring only at the top and bottom. This allowed us to determine the structural properties of wurtzite In(1-x)Ga(x)As. The InP-In(1-x)Ga(x)As core-shell nanowires show a triangular and hexagonal facet structure of {1100} and {101̅0} planes. X-ray diffraction measurements showed that the core and the shell are pseudomorphic along the c-axis, and the strained axial lattice constant is closer to the relaxed In(1-x)Ga(x)As shell. Microphotoluminescence measurements of the nanowires show emission in the infrared regime, which makes them suitable for applications in optical communication.Entities:
Keywords: InGaAs; InP; Nanowire; X-ray diffraction; core−shell; wurtzite
Year: 2015 PMID: 25714126 DOI: 10.1021/nl5049127
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189